Commit-Level, Neural Vulnerability Detection and Assessment

Yi Li, Aashish Yadavally, Jiaxing Zhang, Shaohua Wang, Tien N. Nguyen. Commit-Level, Neural Vulnerability Detection and Assessment. In Satish Chandra 0001, Kelly Blincoe, Paolo Tonella, editors, Proceedings of the 31st ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, ESEC/FSE 2023, San Francisco, CA, USA, December 3-9, 2023. pages 1024-1036, ACM, 2023. [doi]

@inproceedings{LiYZWN23,
  title = {Commit-Level, Neural Vulnerability Detection and Assessment},
  author = {Yi Li and Aashish Yadavally and Jiaxing Zhang and Shaohua Wang and Tien N. Nguyen},
  year = {2023},
  doi = {10.1145/3611643.3616346},
  url = {https://doi.org/10.1145/3611643.3616346},
  researchr = {https://researchr.org/publication/LiYZWN23},
  cites = {0},
  citedby = {0},
  pages = {1024-1036},
  booktitle = {Proceedings of the 31st ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, ESEC/FSE 2023, San Francisco, CA, USA, December 3-9, 2023},
  editor = {Satish Chandra 0001 and Kelly Blincoe and Paolo Tonella},
  publisher = {ACM},
}