Yi Li, Aashish Yadavally, Jiaxing Zhang, Shaohua Wang, Tien N. Nguyen. Commit-Level, Neural Vulnerability Detection and Assessment. In Satish Chandra 0001, Kelly Blincoe, Paolo Tonella, editors, Proceedings of the 31st ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering, ESEC/FSE 2023, San Francisco, CA, USA, December 3-9, 2023. pages 1024-1036, ACM, 2023. [doi]
Abstract is missing.