Exploratory study on circuit and architecture design of very high density diode-switch phase change memories

Shu Li, Tong Zhang. Exploratory study on circuit and architecture design of very high density diode-switch phase change memories. In 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA. pages 424-429, IEEE, 2009. [doi]

Authors

Shu Li

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Tong Zhang

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