Exploring a Bayesian Optimization Framework Compatible with Digital Standard Flow for Soft-Error-Tolerant Circuit

Yan Li, Xiaoyoung Zeng, Zhengqi Gao, Liyu Lin, Jun Tao 0001, Jun Han 0003, Xu Cheng 0002, Mehdi B. Tahoori, Xiaoyang Zeng. Exploring a Bayesian Optimization Framework Compatible with Digital Standard Flow for Soft-Error-Tolerant Circuit. In 57th ACM/IEEE Design Automation Conference, DAC 2020, San Francisco, CA, USA, July 20-24, 2020. pages 1-6, IEEE, 2020. [doi]

Authors

Yan Li

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Xiaoyoung Zeng

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Zhengqi Gao

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Liyu Lin

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Jun Tao 0001

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Jun Han 0003

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Xu Cheng 0002

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Mehdi B. Tahoori

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Xiaoyang Zeng

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