Improving CT Quality for Complex Objects With the Novel Autoexposure Imaging of Stepped Voltage Scanning

Yihong Li, Xiaojie Zhao, Yan Han, Ping Chen 0004. Improving CT Quality for Complex Objects With the Novel Autoexposure Imaging of Stepped Voltage Scanning. IEEE T. Instrumentation and Measurement, 72:1-10, 2023. [doi]

Abstract

Abstract is missing.