Xiuyuan Li, Yulong Zhao, Tengjiang Hu, Qi Zhang, Yingxue Li. A high-speed image super-resolution algorithm based on sparse representation for MEMS defect detection. In 11th IEEE Annual International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2016, Sendai, Japan, April 17-20, 2016. pages 229-232, IEEE, 2016. [doi]
Abstract is missing.