An Improved Low-Noise Processing Methodology Combined with PCL for Industry Inspection Based on Laser Line Scanner

Jianxiong Li, Qian Zhou, Xinghui Li, Ruiming Chen, Kai Ni. An Improved Low-Noise Processing Methodology Combined with PCL for Industry Inspection Based on Laser Line Scanner. Sensors, 19(15):3398, 2019. [doi]

@article{LiZLCN19,
  title = {An Improved Low-Noise Processing Methodology Combined with PCL for Industry Inspection Based on Laser Line Scanner},
  author = {Jianxiong Li and Qian Zhou and Xinghui Li and Ruiming Chen and Kai Ni},
  year = {2019},
  doi = {10.3390/s19153398},
  url = {https://doi.org/10.3390/s19153398},
  researchr = {https://researchr.org/publication/LiZLCN19},
  cites = {0},
  citedby = {0},
  journal = {Sensors},
  volume = {19},
  number = {15},
  pages = {3398},
}