An Improved Low-Noise Processing Methodology Combined with PCL for Industry Inspection Based on Laser Line Scanner

Jianxiong Li, Qian Zhou, Xinghui Li, Ruiming Chen, Kai Ni. An Improved Low-Noise Processing Methodology Combined with PCL for Industry Inspection Based on Laser Line Scanner. Sensors, 19(15):3398, 2019. [doi]

Abstract

Abstract is missing.