Symbolic Simulation Enhanced Coverage-Directed Fuzz Testing of RTL Design

Tun Li, Hongji Zou, Dan Luo, WanXia Qu. Symbolic Simulation Enhanced Coverage-Directed Fuzz Testing of RTL Design. In IEEE International Symposium on Circuits and Systems, ISCAS 2021, Daegu, South Korea, May 22-28, 2021. pages 1-5, IEEE, 2021. [doi]

Authors

Tun Li

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Hongji Zou

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Dan Luo

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WanXia Qu

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