Linyi Li, Yuhao Zhang, Luyao Ren, Yingfei Xiong 0001, Tao Xie 0001. Reliability Assurance for Deep Neural Network Architectures Against Numerical Defects. In 45th IEEE/ACM International Conference on Software Engineering, ICSE 2023, Melbourne, Australia, May 14-20, 2023. pages 1827-1839, IEEE, 2023. [doi]
Abstract is missing.