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Electromagnetic susceptibility characterization of double SOI device

B. Li, K. Zhao, Janfei Wu, X. Zhao, J. Su, J. Gao, C. Gao, J. Luo. Electromagnetic susceptibility characterization of double SOI device. Microelectronics Reliability, 64:168-171, 2016. [doi]

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B. Li

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K. Zhao

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Janfei Wu

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X. Zhao

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J. Su

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J. Gao

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C. Gao

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J. Luo

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