B. Li, K. Zhao, Janfei Wu, X. Zhao, J. Su, J. Gao, C. Gao, J. Luo. Electromagnetic susceptibility characterization of double SOI device. Microelectronics Reliability, 64:168-171, 2016. [doi]
@article{LiZWZSGGL16,
title = {Electromagnetic susceptibility characterization of double SOI device},
author = {B. Li and K. Zhao and Janfei Wu and X. Zhao and J. Su and J. Gao and C. Gao and J. Luo},
year = {2016},
doi = {10.1016/j.microrel.2016.07.121},
url = {http://dx.doi.org/10.1016/j.microrel.2016.07.121},
researchr = {https://researchr.org/publication/LiZWZSGGL16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {64},
pages = {168-171},
}