Tao Li, Wenjun Zhang, Zhiping Yu. Full-chip leakage analysis in nano-scale technologies: mechanisms, variation sources, and verification. In Limor Fix, editor, Proceedings of the 45th Design Automation Conference, DAC 2008, Anaheim, CA, USA, June 8-13, 2008. pages 594-599, ACM, 2008. [doi]
@inproceedings{LiZY08:6,
title = {Full-chip leakage analysis in nano-scale technologies: mechanisms, variation sources, and verification},
author = {Tao Li and Wenjun Zhang and Zhiping Yu},
year = {2008},
doi = {10.1145/1391469.1391622},
url = {http://doi.acm.org/10.1145/1391469.1391622},
tags = {points-to analysis, analysis, source-to-source, open-source},
researchr = {https://researchr.org/publication/LiZY08%3A6},
cites = {0},
citedby = {0},
pages = {594-599},
booktitle = {Proceedings of the 45th Design Automation Conference, DAC 2008, Anaheim, CA, USA, June 8-13, 2008},
editor = {Limor Fix},
publisher = {ACM},
isbn = {978-1-60558-115-6},
}