Tao Li, Wenjun Zhang, Zhiping Yu. Full-chip leakage analysis in nano-scale technologies: mechanisms, variation sources, and verification. In Limor Fix, editor, Proceedings of the 45th Design Automation Conference, DAC 2008, Anaheim, CA, USA, June 8-13, 2008. pages 594-599, ACM, 2008. [doi]
Abstract is missing.