Reliability Evaluation and Failure Simulation Research of the PIN Limiter in Complex Electromagnetic Environments

Lan Li, Yang Zhang 0068, Lishan Zhao, Xingjun Ge, Yuwei Fan. Reliability Evaluation and Failure Simulation Research of the PIN Limiter in Complex Electromagnetic Environments. IEEE Access, 14:62334-62346, 2026. [doi]

Abstract

Abstract is missing.