Investigation on LDMOS-SCR with high holding current for high voltage ESD protection

Hailian Liang, Xiuwen Bi, Xiaofeng Gu, Huafeng Cao, Yun Zhang. Investigation on LDMOS-SCR with high holding current for high voltage ESD protection. Microelectronics Reliability, 61:120-124, 2016. [doi]

Abstract

Abstract is missing.