Yiping Liang, Libing Bai, Lulu Tian, Xu Zhang, Chao Ren, Dan Shao, Zhenzhong Ma, Mosi Sun. Enhanced Diffusion-Based Analysis for Fast Defect Detection in ECPT Image. IEEE Trans. Industrial Informatics, 20(2):2884-2896, February 2024. [doi]
@article{LiangBTZRSMS24,
title = {Enhanced Diffusion-Based Analysis for Fast Defect Detection in ECPT Image},
author = {Yiping Liang and Libing Bai and Lulu Tian and Xu Zhang and Chao Ren and Dan Shao and Zhenzhong Ma and Mosi Sun},
year = {2024},
month = {February},
doi = {10.1109/TII.2023.3298469},
url = {https://doi.org/10.1109/TII.2023.3298469},
researchr = {https://researchr.org/publication/LiangBTZRSMS24},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Industrial Informatics},
volume = {20},
number = {2},
pages = {2884-2896},
}