Yiping Liang, Libing Bai, Lulu Tian, Xu Zhang, Chao Ren, Dan Shao, Zhenzhong Ma, Mosi Sun. Enhanced Diffusion-Based Analysis for Fast Defect Detection in ECPT Image. IEEE Trans. Industrial Informatics, 20(2):2884-2896, February 2024. [doi]
Abstract is missing.