Bin Liang, Yankang Du. Two sides of pulse quenching effect on the single-event transient pulse width at circuit-level. In IEEE 10th International Conference on ASIC, ASICON 2013, Shenzhen, China, October 28-31, 2013. pages 1-4, IEEE, 2013. [doi]
@inproceedings{LiangD13-0,
title = {Two sides of pulse quenching effect on the single-event transient pulse width at circuit-level},
author = {Bin Liang and Yankang Du},
year = {2013},
doi = {10.1109/ASICON.2013.6811956},
url = {http://dx.doi.org/10.1109/ASICON.2013.6811956},
researchr = {https://researchr.org/publication/LiangD13-0},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE 10th International Conference on ASIC, ASICON 2013, Shenzhen, China, October 28-31, 2013},
publisher = {IEEE},
isbn = {978-1-4673-6415-7},
}