Bin Liang, Yankang Du, Hui Xu. Mitigating the SERs of large combinational circuits by using half guard band technique in CMOS bulk technology. IEICE Electronic Express, 11(19):20140710, 2014. [doi]
@article{LiangDX14,
title = {Mitigating the SERs of large combinational circuits by using half guard band technique in CMOS bulk technology},
author = {Bin Liang and Yankang Du and Hui Xu},
year = {2014},
doi = {10.1587/elex.11.20140710},
url = {http://dx.doi.org/10.1587/elex.11.20140710},
researchr = {https://researchr.org/publication/LiangDX14},
cites = {0},
citedby = {0},
journal = {IEICE Electronic Express},
volume = {11},
number = {19},
pages = {20140710},
}