An Effective Methodology for Mixed Scan and Reset Design Based on Test Generation and Structure of Sequential Circuits - researchr publication authors

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Hsing-Chung Liang, Chung-Len Lee. An Effective Methodology for Mixed Scan and Reset Design Based on Test Generation and Structure of Sequential Circuits. In 8th Asian Test Symposium (ATS 99), 16-18 November 1999, Shanghai, China. pages 173-178, IEEE Computer Society, 1999. [doi]

This author has not been identified. Look up 'Hsing-Chung Liang' in GoogleThis author has not been identified. Look up 'Chung-Len Lee' in Google

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