Hsing-Chung Liang, Chung-Len Lee, Jwu E. Chen. Identifying Untestable Faults in Sequential Circuits. IEEE Design & Test of Computers, 12(3):14-23, 1995. [doi]
@article{LiangLC95,
title = {Identifying Untestable Faults in Sequential Circuits},
author = {Hsing-Chung Liang and Chung-Len Lee and Jwu E. Chen},
year = {1995},
doi = {10.1109/MDT.1995.466367},
url = {http://doi.ieeecomputersociety.org/10.1109/MDT.1995.466367},
tags = {e-science},
researchr = {https://researchr.org/publication/LiangLC95},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {12},
number = {3},
pages = {14-23},
}