Feng Liang, Sheng Ma, Joseph L. Hellerstein. Discovering Fully Dependent Patterns. In Robert L. Grossman, Jiawei Han, Vipin Kumar, Heikki Mannila, Rajeev Motwani, editors, Proceedings of the Second SIAM International Conference on Data Mining, Arlington, VA, USA, April 11-13, 2002. pages 511-527, SIAM, 2002. [doi]
Abstract is missing.