Attentive Deep K-SVD Network for Patch Correlated Image Denoising

Yiwen Liang, Lu Wang, Jianfei Wang, Ye Luo. Attentive Deep K-SVD Network for Patch Correlated Image Denoising. In IEEE International Conference on Image Processing, ICIP 2023, Kuala Lumpur, Malaysia, October 8-11, 2023. pages 1490-1494, IEEE, 2023. [doi]

Abstract

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