FIT: Inspect vulnerabilities in cross-architecture firmware by deep learning and bipartite matching

Hongliang Liang, Zhuosi Xie, Yixiu Chen, Hua Ning, Jianli Wang. FIT: Inspect vulnerabilities in cross-architecture firmware by deep learning and bipartite matching. Computers & Security, 99:102032, 2020. [doi]

Authors

Hongliang Liang

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Zhuosi Xie

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Yixiu Chen

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Hua Ning

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Jianli Wang

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