FIT: Inspect vulnerabilities in cross-architecture firmware by deep learning and bipartite matching

Hongliang Liang, Zhuosi Xie, Yixiu Chen, Hua Ning, Jianli Wang. FIT: Inspect vulnerabilities in cross-architecture firmware by deep learning and bipartite matching. Computers & Security, 99:102032, 2020. [doi]

Abstract

Abstract is missing.