Zhonghao Liao, George T. Amariucai, Raymond K. W. Wong, Yong Guan. The impact of discharge inversion effect on learning SRAM power-up statistics. In 2017 Asian Hardware Oriented Security and Trust Symposium, AsianHOST 2017, Beijing, China, October 19-20, 2017. pages 31-36, IEEE Computer Society, 2017. [doi]
Abstract is missing.