Hui Liao, Yixian Feng, Jiaying Jian. CS-WRN few-shot recognition model with dual attention mechanism for metal defect images. In 6th IEEE International Conference on Information Systems and Computer Aided Educatio, ICISCAE 2023, Dalian, China, September 23-25, 2023. pages 1136-1143, IEEE, 2023. [doi]
Abstract is missing.