Localization of Marginal Circuits for Yield Diagnostics Utilizing a Dynamic Laser Stimulation Probing System

J. Y. Liao, G. L. Woods, X. Chen, H. L. Marks. Localization of Marginal Circuits for Yield Diagnostics Utilizing a Dynamic Laser Stimulation Probing System. Microelectronics Reliability, 45(9-11):1554-1557, 2005. [doi]

Abstract

Abstract is missing.