Classifying Intelligence Tests Patterns Using Machine Learning Methods

Georgios Liapis, Loukritira Stefanou, Ioannis P. Vlahavas. Classifying Intelligence Tests Patterns Using Machine Learning Methods. In Maria De Marsico, Gabriella Sanniti di Baja, Ana L. N. Fred, editors, Proceedings of the 12th International Conference on Pattern Recognition Applications and Methods, ICPRAM 2023, Lisbon, Portugal, February 22-24, 2023. pages 717-724, SCITEPRESS, 2023. [doi]

Abstract

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