Eric Liau, Doris Schmitt-Landsiedel. Evolution of automatic semiconductor test equipment: automatic test pattern learning, classification, optimisation and generation for power supply noise. In IEEE International Conference on Virtual Environments, Human-Computer Interfaces and Measurement Systems, VECIMS 2003, Lugano, Switzerland, 27-29 July 2003. pages 39-44, IEEE, 2003. [doi]
Abstract is missing.