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    Scalable statistical bug isolation

    Ben Liblit, Mayur Naik, Alice X. Zheng, Alexander Aiken, Michael I. Jordan. Scalable statistical bug isolation. In Vivek Sarkar, Mary W. Hall, editors, Proceedings of the ACM SIGPLAN 2005 Conference on Programming Language Design and Implementation, Chicago, IL, USA, June 12-15, 2005. pages 15-26, ACM, 2005. [doi]

    Authors

    Ben Liblit

    Identified as Ben Liblit

    Mayur Naik

    This author has not been identified. Look up 'Mayur Naik' in Google

    Alice X. Zheng

    This author has not been identified. Look up 'Alice X. Zheng' in Google

    Alexander Aiken

    This author has not been identified. Look up 'Alexander Aiken' in Google

    Michael I. Jordan

    This author has not been identified. Look up 'Michael I. Jordan' in Google
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