Ben Liblit, Mayur Naik, Alice X. Zheng, Alexander Aiken, Michael I. Jordan. Scalable statistical bug isolation. In Vivek Sarkar, Mary W. Hall, editors, Proceedings of the ACM SIGPLAN 2005 Conference on Programming Language Design and Implementation, Chicago, IL, USA, June 12-15, 2005. pages 15-26, ACM, 2005. [doi]
@inproceedings{LiblitNZAJ05,
title = {Scalable statistical bug isolation},
author = {Ben Liblit and Mayur Naik and Alice X. Zheng and Alexander Aiken and Michael I. Jordan},
year = {2005},
doi = {10.1145/1065010.1065014},
url = {http://doi.acm.org/10.1145/1065010.1065014},
tags = {case study, debugging},
researchr = {https://researchr.org/publication/LiblitNZAJ05},
cites = {0},
citedby = {0},
pages = {15-26},
booktitle = {Proceedings of the ACM SIGPLAN 2005 Conference on Programming Language Design and Implementation, Chicago, IL, USA, June 12-15, 2005},
editor = {Vivek Sarkar and Mary W. Hall},
publisher = {ACM},
isbn = {1-59593-056-6},
}