Yossi Lichtenstein, Yossi Malka, Aharon Aharon. Model Based Test Generation for Processor Verification. In Elizabeth Byrnes, Jan Aikins, editors, Proceedings of the Sixth Annual Conference on Innovative Applications of Artificial Intelligence, IAAI 1994, Seattle, Washington, USA, August 1-4, 1994. AAAI Press, 1994. [doi]
Abstract is missing.