Jonas Lick, Fiona Kattenstroth, Hendrik van der Valk, Malte Trienens, Arno Kühn, Roman Dumitrescu. Characterizing Digital Factory Twins: Deriving Archetypes for Research and Industry. In Winter Simulation Conference, WSC 2025, Seattle, WA, USA, December 7-10, 2025. pages 1-12, IEEE, 2025. [doi]
Abstract is missing.