Peter Lidén, Peter Dahlgren, Jan Torin. Transistor Fault Coverage for Self-Testing CMOS Checkers. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 476-485, IEEE Computer Society, 1992.
@inproceedings{LidenDT92,
title = {Transistor Fault Coverage for Self-Testing CMOS Checkers},
author = {Peter Lidén and Peter Dahlgren and Jan Torin},
year = {1992},
tags = {test coverage, testing, coverage},
researchr = {https://researchr.org/publication/LidenDT92},
cites = {0},
citedby = {0},
pages = {476-485},
booktitle = {Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992},
publisher = {IEEE Computer Society},
isbn = {0-7803-0760-7},
}