Output selection for test response compaction based on multiple counters - researchr publication authors

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Wei-Cheng Lien, Kuen-Jong Lee, Krishnendu Chakrabarty, Tong-Yu Hsieh. Output selection for test response compaction based on multiple counters. In Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2014, Hsinchu, Taiwan, April 28-30, 2014. pages 1-4, IEEE, 2014. [doi]

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