Wei-Cheng Lien, Kuen-Jong Lee, Krishnendu Chakrabarty, Tong-Yu Hsieh. Output selection for test response compaction based on multiple counters. In Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2014, Hsinchu, Taiwan, April 28-30, 2014. pages 1-4, IEEE, 2014. [doi]
@inproceedings{LienLCH14-0,
title = {Output selection for test response compaction based on multiple counters},
author = {Wei-Cheng Lien and Kuen-Jong Lee and Krishnendu Chakrabarty and Tong-Yu Hsieh},
year = {2014},
doi = {10.1109/VLSI-DAT.2014.6834865},
url = {http://dx.doi.org/10.1109/VLSI-DAT.2014.6834865},
researchr = {https://researchr.org/publication/LienLCH14-0},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2014, Hsinchu, Taiwan, April 28-30, 2014},
publisher = {IEEE},
}