Prognostics and Health Management of Wafer Chemical-Mechanical Polishing System using Autoencoder

Kart Leong Lim, Rahul Dutta. Prognostics and Health Management of Wafer Chemical-Mechanical Polishing System using Autoencoder. In International IEEE Conference on Prognostics and Health Management, ICPHM 2021, Detroit, MI, USA, June 7-9, 2021. pages 1-8, IEEE, 2021. [doi]

Authors

Kart Leong Lim

This author has not been identified. Look up 'Kart Leong Lim' in Google

Rahul Dutta

This author has not been identified. Look up 'Rahul Dutta' in Google