Hyeonchan Lim, Tae-Hyun Kim, Seunghwan Kim, Sungho Kang. Diagnosis of Scan Chain Faults Based-on Machine-Learning. In International SoC Design Conference, ISOCC 2020, Yeosu, South Korea, October 21-24, 2020. pages 57-58, IEEE, 2020. [doi]
Abstract is missing.