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Numerical and Experimental Analysis of Potential Causes Degrading Contact Resistances and Forces of Sensor Connectors for Vehicles

Jangmuk Lim, Hansu Kim, Jae-Kyun Kim, Sung-Joon Park, Tae Hee Lee, Sang-Won Yoon. Numerical and Experimental Analysis of Potential Causes Degrading Contact Resistances and Forces of Sensor Connectors for Vehicles. IEEE Access, 7:126530-126538, 2019. [doi]

Authors

Jangmuk Lim

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Hansu Kim

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Jae-Kyun Kim

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Sung-Joon Park

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Tae Hee Lee

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Sang-Won Yoon

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