Jangmuk Lim, Hansu Kim, Jae-Kyun Kim, Sung-Joon Park, Tae Hee Lee, Sang-Won Yoon. Numerical and Experimental Analysis of Potential Causes Degrading Contact Resistances and Forces of Sensor Connectors for Vehicles. IEEE Access, 7:126530-126538, 2019. [doi]
@article{LimKKPLY19,
title = {Numerical and Experimental Analysis of Potential Causes Degrading Contact Resistances and Forces of Sensor Connectors for Vehicles},
author = {Jangmuk Lim and Hansu Kim and Jae-Kyun Kim and Sung-Joon Park and Tae Hee Lee and Sang-Won Yoon},
year = {2019},
doi = {10.1109/ACCESS.2019.2939377},
url = {https://doi.org/10.1109/ACCESS.2019.2939377},
researchr = {https://researchr.org/publication/LimKKPLY19},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {7},
pages = {126530-126538},
}