Bee Lim, Sanghyun Son, Heewon Kim, Seungjun Nah, Kyoung Mu Lee. Enhanced Deep Residual Networks for Single Image Super-Resolution. In 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops, Honolulu, HI, USA, July 21-26, 2017. pages 1132-1140, IEEE Computer Society, 2017. [doi]
Abstract is missing.