Jongin Lim, Sangdoo Yun, Seulki Park, Jin Young Choi 0002. Hypergraph-Induced Semantic Tuplet Loss for Deep Metric Learning. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022, New Orleans, LA, USA, June 18-24, 2022. pages 212-222, IEEE, 2022. [doi]
Abstract is missing.