João Paulo Cardoso de Lima, Rafael Fão de Moura, Luigi Carro. Leveraging reuse and endurance by efficient mapping and placement for NVM-based FPGAs. In 26th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2020, Napoli, Italy, July 13-15, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{LimaMC20-0,
title = {Leveraging reuse and endurance by efficient mapping and placement for NVM-based FPGAs},
author = {João Paulo Cardoso de Lima and Rafael Fão de Moura and Luigi Carro},
year = {2020},
doi = {10.1109/IOLTS50870.2020.9159743},
url = {https://doi.org/10.1109/IOLTS50870.2020.9159743},
researchr = {https://researchr.org/publication/LimaMC20-0},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {26th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2020, Napoli, Italy, July 13-15, 2020},
publisher = {IEEE},
isbn = {978-1-7281-8187-5},
}