Automated visual inspection of ripple defects using wavelet characteristic based multivariate statistical approach

Hong-Dar Lin. Automated visual inspection of ripple defects using wavelet characteristic based multivariate statistical approach. Image Vision Comput., 25(11):1785-1801, 2007. [doi]

@article{Lin07:48,
  title = {Automated visual inspection of ripple defects using wavelet characteristic based multivariate statistical approach},
  author = {Hong-Dar Lin},
  year = {2007},
  doi = {10.1016/j.imavis.2007.02.002},
  url = {http://dx.doi.org/10.1016/j.imavis.2007.02.002},
  tags = {rule-based, systematic-approach},
  researchr = {https://researchr.org/publication/Lin07%3A48},
  cites = {0},
  citedby = {0},
  journal = {Image Vision Comput.},
  volume = {25},
  number = {11},
  pages = {1785-1801},
}