Hong-Dar Lin - researchr alias

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Viewing Publication 1 - 23 from 23

2023

Optical Panel Inspection Using Explicit Band Gaussian Filtering Methods in Discrete Cosine DomainHong-Dar Lin, Huan-Hua Tsai, Chou-Hsien Lin, Hung-Tso Chang. sensors, 23(3):1737, February 2023. [doi]

Optical Imaging Deformation Inspection and Quality Level Determination of Multifocal GlassesHong-Dar Lin, Tung-Hsin Lee, Chou-Hsien Lin, Hsin-Chieh Wu. sensors, 23(9):4497, 2023. [doi]

2022

Incorporating Visual Defect Identification and Determination of Occurrence Side in Touch Panel Quality InspectionHong-Dar Lin, Zi-Ting Qiu, Chou-Hsien Lin. access, 10:90213-90228, 2022. [doi]

2018

Advanced Artificial Neural NetworksTin-Chih Toly Chen, Cheng-Li Liu, Hong-Dar Lin. algorithms, 11(7):102, 2018. [doi]

2013

An innovative blemish detection system for curved LED lensesYuan-Shyi Peter Chiu, Hong-Dar Lin. eswa, 40(2):471-479, 2013. [doi]

A note on "intra-supply chain system with multiple sales locations and quality assurance"Hong-Dar Lin, Fan-Yun Pai, Singa Wang Chiu. eswa, 40(11):4730-4732, 2013. [doi]

Corrigendum to 'A note on "Intra-supply chain system with multiple sales locations and quality assurance"' [Experts Systems with Applications 40 (11) (2013) 4730-4732]Hong-Dar Lin, Fan-Yun Pai, Singa Wang Chiu. eswa, 40(15):6222, 2013. [doi]

2012

Note on "replenishment run time problem with machine breakdown and failure in rework"Hong-Dar Lin, Yuan-Shyi Peter Chiu. eswa, 39(17):13070-13072, 2012. [doi]

2011

Mathematical modeling for solving manufacturing run time problem with defective rate and random machine breakdownYuan-Shyi Peter Chiu, Hong-Dar Lin, Huei-Hsin Chang. candie, 60(4):576-584, 2011. [doi]

Computational Optimization of Manufacturing Batch Size and Shipment for an Integrated EPQ Model with ScrapYuan-Shyi Peter Chiu, Hong-Dar Lin, Ming-Hon Hwang, Nong Pan. ajcm, 1(3):202-207, 2011. [doi]

Flaw detection of domed surfaces in LED packages by machine vision systemHong-Dar Lin, Singa Wang Chiu. eswa, 38(12):15208-15216, 2011. [doi]

2010

Automated Industrial Inspection of LED Chips Using Multivariate Factor AnalysisHong-Dar Lin, Chung-Yu Chung, Wan-Ting Lin. ipcv 2010: 283-288

2009

A hybrid approach based on Hotelling statistics for automated visual inspection of display blemishes in LCD panelsYuan-Shyi Peter Chiu, Hong-Dar Lin. eswa, 36(10):12332-12339, 2009. [doi]

Automated defect inspection of light-emitting diode chips using neural network and statistical approachesHong-Dar Lin. eswa, 36(1):219-226, 2009. [doi]

Automated Industrial Inspection of Light-emitting Diodes Using Computer VisionHong-Dar Lin, Yuan-Shyi Peter Chiu, Wan-Ting Lin. ipcv 2009: 59-65

Automated process adjustments of chip cutting operations using neural network and statistical approachesHong-Dar Lin, Wan-Ting Lin. eswa, 36(3):4338-4345, 2009. [doi]

2008

Tiny surface defect inspection of electronic passive components using discrete cosine transform decomposition and cumulative sum techniquesHong-Dar Lin. ivc, 26(5):603-621, 2008. [doi]

A note on optimal replenishment policy for imperfect quality EMQ model with rework and backloggingHong-Dar Lin, Yuan-Shyi Peter Chiu, Chia-Kuan Ting. cma, 56(11):2819-2824, 2008. [doi]

2007

Computer-Aided Vision System for Surface Blemish Detection of LED ChipsHong-Dar Lin, Chung-Yu Chung, Singa Wang Chiu. icannga 2007: 525-533 [doi]

A Wavelet-Based Neural Network Applied to Surface Defect Detection of LED ChipsHong-Dar Lin, Chung-Yu Chung. isnn 2007: 785-792 [doi]

Automated visual inspection of ripple defects using wavelet characteristic based multivariate statistical approachHong-Dar Lin. ivc, 25(11):1785-1801, 2007. [doi]

2006

Computer-Aided Vision System for MURA-Type Defect Inspection in Liquid Crystal DisplaysHong-Dar Lin, Singa Wang Chiu. psivt 2006: 442-452 [doi]

Automated Detection of Color Non-Uniformity Defects in TFT-LCDHong-Dar Lin, Chih-Hao Chien. ijcnn 2006: 1405-1412 [doi]

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