Hong-Dar Lin, Chung-Yu Chung, Wan-Ting Lin. Automated Industrial Inspection of LED Chips Using Multivariate Factor Analysis. In Hamid R. Arabnia, Leonidas Deligiannidis, Gerald Schaefer, Ashu M. G. Solo, editors, Proceedings of the 2010 International Conference on Image Processing, Computer Vision, & Pattern Recognition, IPCV 2010, July 12-15, 2010, Las Vegas, Nevada, USA, 2 Volumes. pages 283-288, CSREA Press, 2010.
Abstract is missing.