Hong-Dar Lin, Yuan-Shyi Peter Chiu, Wan-Ting Lin. Automated Industrial Inspection of Light-emitting Diodes Using Computer Vision. In Hamid R. Arabnia, editor, Proceedings of the 2009 International Conference on Image Processing, Computer Vision, & Pattern Recognition, IPCV 2009, July 13-16, 2009, Las Vegas Nevada, USA, 2 Volumes. pages 59-65, CSREA Press, 2009.
Abstract is missing.