Hong-Dar Lin, Chih-Hao Chien. Automated Detection of Color Non-Uniformity Defects in TFT-LCD. In Proceedings of the International Joint Conference on Neural Networks, IJCNN 2006, part of the IEEE World Congress on Computational Intelligence, WCCI 2006, Vancouver, BC, Canada, 16-21 July 2006. pages 1405-1412, IEEE, 2006. [doi]
Abstract is missing.